电荷注入接触对有机发光二极管(OLED)性能的影响

S. Mehdi, A. Aissat
{"title":"电荷注入接触对有机发光二极管(OLED)性能的影响","authors":"S. Mehdi, A. Aissat","doi":"10.1109/IRSEC.2018.8702912","DOIUrl":null,"url":null,"abstract":"Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.","PeriodicalId":186042,"journal":{"name":"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of the Charges Injection Contact on the Performance of Organic Light Emitting Diode (OLED)\",\"authors\":\"S. Mehdi, A. Aissat\",\"doi\":\"10.1109/IRSEC.2018.8702912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\\\\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.\",\"PeriodicalId\":186042,\"journal\":{\"name\":\"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRSEC.2018.8702912\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRSEC.2018.8702912","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

我们的模拟包括研究由空穴注入层(HIL) /电子传输层(ETL)形成的有机发光二极管(OLED)。我们已经表示了J-L-V特性;研究了电场在器件上的分布,并研究了电荷载流子注入接触对OLED性能的影响。模拟结果表明,电荷注入高度与势垒接触高度密切相关,提高了91.15% in the charge carrier was achieved from a height barrier $\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of the Charges Injection Contact on the Performance of Organic Light Emitting Diode (OLED)
Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信