{"title":"电荷注入接触对有机发光二极管(OLED)性能的影响","authors":"S. Mehdi, A. Aissat","doi":"10.1109/IRSEC.2018.8702912","DOIUrl":null,"url":null,"abstract":"Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.","PeriodicalId":186042,"journal":{"name":"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of the Charges Injection Contact on the Performance of Organic Light Emitting Diode (OLED)\",\"authors\":\"S. Mehdi, A. Aissat\",\"doi\":\"10.1109/IRSEC.2018.8702912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\\\\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.\",\"PeriodicalId\":186042,\"journal\":{\"name\":\"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRSEC.2018.8702912\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 6th International Renewable and Sustainable Energy Conference (IRSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRSEC.2018.8702912","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
我们的模拟包括研究由空穴注入层(HIL) /电子传输层(ETL)形成的有机发光二极管(OLED)。我们已经表示了J-L-V特性;研究了电场在器件上的分布,并研究了电荷载流子注入接触对OLED性能的影响。模拟结果表明,电荷注入高度与势垒接触高度密切相关,提高了91.15% in the charge carrier was achieved from a height barrier $\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.
Effect of the Charges Injection Contact on the Performance of Organic Light Emitting Diode (OLED)
Our simulations consists of studying the organic light emitting diode (OLED) formed by Hole Injection Layer (HIL) /Electron Transport Layer (ETL). We have represented the J-L-V characteristic; the distribution of the electric filed across the device, and investigated the effect of the charge carrier injection contact on the performance of the OLED. The simulation results shows that the charge injection depends strongly on the height barrier contact, we have an improvement of 91.15% in the charge carrier was achieved from a height barrier $\leq$0.2eV, and therefore decrease the turn-on voltage by 70%, and the reduction in the height barrier contact results an increase in the formation of the Langevin recombination rate the emission of photon.