测量复杂反射系数的反射计系统仿真

2010 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems Pub Date : 2010-10-25 DOI:10.1109/VECIMS.2010.5609339

E. A. Kadir, Husna Abd. Rahman, Nesamalar Kantasamu, N. Misran

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引用次数: 0

摘要

本文介绍了一种用于复杂反射系数测量的三探头反射计系统的仿真。这涉及到使用Genesys软件设计一个反射计电路。仿真结果与已发表的三探头反射计测量系统的数据进行了比较，验证了仿真结果的准确性。利用设计电路制作微带电路，利用矢量网络分析仪(VNA)测量复杂反射系数。将仿真、VNA和公布数据进行了比较。从比较中可以看出，两者之间有着密切的一致性。结果表明，微带反射计可以用于测量复反射系数。

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Simulation of reflectometer system for complex reflection coefficient measurements

This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstrip circuit will be fabricated and complex reflection coefficients were measured using Vector Network Analyzer (VNA). A comparison was made between simulations, VNA and publishes data. From the comparison, it shows a close agreement between them. It shows that Microstrip Reflectometer can be used to measure Complex Reflection Coefficient.

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2010 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems

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