{"title":"急慢性损伤(CTD)过程的简单电模型","authors":"J. LaCourse, T. McCoy","doi":"10.1109/NEBC.1994.305173","DOIUrl":null,"url":null,"abstract":"A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes.<<ETX>>","PeriodicalId":117140,"journal":{"name":"Proceedings of 1994 20th Annual Northeast Bioengineering Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A simple electrical model of acute and chronic injury (CTD) processes\",\"authors\":\"J. LaCourse, T. McCoy\",\"doi\":\"10.1109/NEBC.1994.305173\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes.<<ETX>>\",\"PeriodicalId\":117140,\"journal\":{\"name\":\"Proceedings of 1994 20th Annual Northeast Bioengineering Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 20th Annual Northeast Bioengineering Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEBC.1994.305173\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 20th Annual Northeast Bioengineering Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEBC.1994.305173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simple electrical model of acute and chronic injury (CTD) processes
A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes.<>
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