{"title":"MOSFET电热参数波动对桥式逆变器热状态的影响","authors":"N. Bespalov, A. Lysenkov","doi":"10.1109/APEIE.2016.7807087","DOIUrl":null,"url":null,"abstract":"The article considers the problem of the influence of techological fluctuation of power MOSFET's thermal resistance on the thermal conditions in a bridge inverter. MOSFET's electrothermal model is described. Simulation results of electrothermal processes occurring in the simultaneously working bridge inverter's switches are presented. Experimental data supporting calculations is given.","PeriodicalId":363890,"journal":{"name":"2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","volume":"17 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Influence of fluctuation of MOSFET's electrothermal parameter on thermal conditions in bridge inverter\",\"authors\":\"N. Bespalov, A. Lysenkov\",\"doi\":\"10.1109/APEIE.2016.7807087\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article considers the problem of the influence of techological fluctuation of power MOSFET's thermal resistance on the thermal conditions in a bridge inverter. MOSFET's electrothermal model is described. Simulation results of electrothermal processes occurring in the simultaneously working bridge inverter's switches are presented. Experimental data supporting calculations is given.\",\"PeriodicalId\":363890,\"journal\":{\"name\":\"2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"volume\":\"17 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEIE.2016.7807087\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEIE.2016.7807087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of fluctuation of MOSFET's electrothermal parameter on thermal conditions in bridge inverter
The article considers the problem of the influence of techological fluctuation of power MOSFET's thermal resistance on the thermal conditions in a bridge inverter. MOSFET's electrothermal model is described. Simulation results of electrothermal processes occurring in the simultaneously working bridge inverter's switches are presented. Experimental data supporting calculations is given.