{"title":"分析了DAC分辨率对低频标准交流电压数字信号源产生的信号均方根值的影响","authors":"M. Kampik","doi":"10.1109/I2MTC.2013.6555402","DOIUrl":null,"url":null,"abstract":"The paper presents an analysis of the effect of the digital-to-analog converter (DAC) resolution on the RMS value of the sinusoidal signal generated by the digitally synthesized source (DSS) of low-frequency standard AC voltage. The analysis applies to the DSS operating in the constant sampling time (CST) mode and being calibrated using the peak-to-peak method.","PeriodicalId":432388,"journal":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Analysis of the effect of DAC resolution on RMS value of the signal generated by the digital source of low-frequency standard AC voltage\",\"authors\":\"M. Kampik\",\"doi\":\"10.1109/I2MTC.2013.6555402\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents an analysis of the effect of the digital-to-analog converter (DAC) resolution on the RMS value of the sinusoidal signal generated by the digitally synthesized source (DSS) of low-frequency standard AC voltage. The analysis applies to the DSS operating in the constant sampling time (CST) mode and being calibrated using the peak-to-peak method.\",\"PeriodicalId\":432388,\"journal\":{\"name\":\"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC.2013.6555402\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC.2013.6555402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of the effect of DAC resolution on RMS value of the signal generated by the digital source of low-frequency standard AC voltage
The paper presents an analysis of the effect of the digital-to-analog converter (DAC) resolution on the RMS value of the sinusoidal signal generated by the digitally synthesized source (DSS) of low-frequency standard AC voltage. The analysis applies to the DSS operating in the constant sampling time (CST) mode and being calibrated using the peak-to-peak method.