考虑记忆效应的失相放大器行为建模

P. Landin, T. Eriksson, J. Fritzin, A. Alvandpour
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引用次数: 1

摘要

提出了一种反相放大器的行为模型结构。在d类CMOS共相放大器上对该模型进行了性能评估,并与文献中发现的两种模型进行了比较。所提出的模型结构还允许在类似hammerstein的并行设置中使用内存。除了参数呈线性外,所提出的模型在相邻信道误差功率比(ACEPR)方面也有大约5db的改善。较低的模型误差使使用和设计改进的预失真器能够考虑到频率依赖性(记忆效应)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Behavioral modeling of outphasing amplifiers considering memory effects
This paper proposes a behavioral model structure for outphasing amplifiers. The model performance is evaluated on a class-D CMOS outphasing amplifier and compared with two models found in the literature. The proposed model structure also allows the use of memory in a parallel Hammerstein-like setting. The proposed models show improvements in adjacent channel error power ratio (ACEPR) of approximately 5 dB in addition to being linear in the parameters. The lower model errors enable the use and design of improved predistorters taking frequency dependency (memory effects) in outphasing amplifiers into account.
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