估算[软件中]剩余缺陷的数量

Y. Malaiya, J. Denton
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引用次数: 16

摘要

残余缺陷的数量是决定一个软件是否准备发布的最重要的因素之一。从理论上讲,人们可以找到所有的缺陷并加以计算。然而,在合理的时间内找到所有的缺陷是不可能的。对于高可靠性软件来说,估计缺陷密度会变得很困难,因为剩余的缺陷可能非常难以测试。一种可能的方法是应用指数软件可靠性增长模型(SRGM),从而估计在测试开始时出现的缺陷总数。在本文中,我们展示了这种方法的问题,并提出了一种基于软件测试覆盖率的新方法。测试覆盖直接度量测试的彻底性,避免了测试有效性变化的问题。我们将此模型应用于实际的测试数据,以预测缺陷的剩余数量。这种方法产生的估计比现有方法更稳定。该方法也更容易理解,并且可以直观地观察到估计的收敛性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Estimating the number of residual defects [in software]
The number of residual defects is one of the most important factors that allows one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count them. However, it is impossible to find all the defects within a reasonable amount of time. Estimating the defect density can become difficult for high-reliability software, since the remaining defects can be extremely hard to test for. One possible way is to apply the exponential software reliablility growth model (SRGM), and thus estimate the total number of defects present at the beginning of testing. In this paper, we show the problems with this approach and present a new approach based on software test coverage. Test coverage directly measures the thoroughness of testing, avoiding the problem of variations of test effectiveness. We apply this model to actual test data in order to project the residual number of defects. This method results in estimates that are more stable than the existing methods. The method is also easier to understand, and the convergence to the estimate can be observed visually.
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