{"title":"窄间隙引起附加微环损耗的分析","authors":"Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen","doi":"10.1109/WOCC.2012.6198183","DOIUrl":null,"url":null,"abstract":"We have analyzed the coupling gap dependent micro-ring loss in a single ring all-pass filter configuration using the two dimension (2D) finite difference time domain (FDTD) and EIM (effective index method). We utilized a new analysis scheme by calculating the transmission signal as a function of input wavelength and fitting the transmission spectrum with a phenomenological ring loss parameter. This novel scheme circumvents the complex waveguide mode analysis process, when the coupling gap is small and the all-pass coupling region becomes multi-mode. We find that the radiation loss increases rapidly with decreasing coupling gap width when the gap reaches 200 nm or below. Our initial results show that the intrinsic bending loss of a silicon micro-ring (on oxide) with a radius of 2.5μm is about 3dB/cm. The total loss of the micro-ring with 150 nm coupling gap reaches 21.82dB/cm.","PeriodicalId":118220,"journal":{"name":"2012 21st Annual Wireless and Optical Communications Conference (WOCC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of narrow gap induced additional micro-ring loss\",\"authors\":\"Kaung-Cheng Lin, Wei-Lun Chang, Ruei Hao You, Yung-Jui Chen\",\"doi\":\"10.1109/WOCC.2012.6198183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have analyzed the coupling gap dependent micro-ring loss in a single ring all-pass filter configuration using the two dimension (2D) finite difference time domain (FDTD) and EIM (effective index method). We utilized a new analysis scheme by calculating the transmission signal as a function of input wavelength and fitting the transmission spectrum with a phenomenological ring loss parameter. This novel scheme circumvents the complex waveguide mode analysis process, when the coupling gap is small and the all-pass coupling region becomes multi-mode. We find that the radiation loss increases rapidly with decreasing coupling gap width when the gap reaches 200 nm or below. Our initial results show that the intrinsic bending loss of a silicon micro-ring (on oxide) with a radius of 2.5μm is about 3dB/cm. The total loss of the micro-ring with 150 nm coupling gap reaches 21.82dB/cm.\",\"PeriodicalId\":118220,\"journal\":{\"name\":\"2012 21st Annual Wireless and Optical Communications Conference (WOCC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 21st Annual Wireless and Optical Communications Conference (WOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WOCC.2012.6198183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 21st Annual Wireless and Optical Communications Conference (WOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WOCC.2012.6198183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of narrow gap induced additional micro-ring loss
We have analyzed the coupling gap dependent micro-ring loss in a single ring all-pass filter configuration using the two dimension (2D) finite difference time domain (FDTD) and EIM (effective index method). We utilized a new analysis scheme by calculating the transmission signal as a function of input wavelength and fitting the transmission spectrum with a phenomenological ring loss parameter. This novel scheme circumvents the complex waveguide mode analysis process, when the coupling gap is small and the all-pass coupling region becomes multi-mode. We find that the radiation loss increases rapidly with decreasing coupling gap width when the gap reaches 200 nm or below. Our initial results show that the intrinsic bending loss of a silicon micro-ring (on oxide) with a radius of 2.5μm is about 3dB/cm. The total loss of the micro-ring with 150 nm coupling gap reaches 21.82dB/cm.