{"title":"利用雷达探测介质材料中埋藏缺陷","authors":"J. Agbinya, J. Devlin, A. Tirkel, C. F. Osborne","doi":"10.1109/APMC.1992.672031","DOIUrl":null,"url":null,"abstract":"Detection of defects in dielectric products using an FMCW radar system is studied. Defect edge detection technique is used. Detectability requires a dielectric constant contrast between the host and the defect, and is impared by window functions, the sweep rate of the signal and the size of the FlT. Results are given in both 1D and 2D.","PeriodicalId":234490,"journal":{"name":"AMPC Asia-Pacific Microwave Conference,","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Detection of Buried Defects in Dielectric Materials Using Radar\",\"authors\":\"J. Agbinya, J. Devlin, A. Tirkel, C. F. Osborne\",\"doi\":\"10.1109/APMC.1992.672031\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Detection of defects in dielectric products using an FMCW radar system is studied. Defect edge detection technique is used. Detectability requires a dielectric constant contrast between the host and the defect, and is impared by window functions, the sweep rate of the signal and the size of the FlT. Results are given in both 1D and 2D.\",\"PeriodicalId\":234490,\"journal\":{\"name\":\"AMPC Asia-Pacific Microwave Conference,\",\"volume\":\"93 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-08-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AMPC Asia-Pacific Microwave Conference,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APMC.1992.672031\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AMPC Asia-Pacific Microwave Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.1992.672031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection of Buried Defects in Dielectric Materials Using Radar
Detection of defects in dielectric products using an FMCW radar system is studied. Defect edge detection technique is used. Detectability requires a dielectric constant contrast between the host and the defect, and is impared by window functions, the sweep rate of the signal and the size of the FlT. Results are given in both 1D and 2D.