Sugil Lee, M. Fouda, Jongeun Lee, A. Eltawil, Fadi J. Kurdahi
{"title":"快速低成本缓解深度学习应用中的ReRAM可变性","authors":"Sugil Lee, M. Fouda, Jongeun Lee, A. Eltawil, Fadi J. Kurdahi","doi":"10.1109/ICCD53106.2021.00051","DOIUrl":null,"url":null,"abstract":"To overcome the programming variability (PV) of ReRAM crossbar arrays (RCAs), the most common method is program-verify, which, however, has high energy and latency overhead. In this paper we propose a very fast and low-cost method to mitigate the effect of PV and other variability for RCA-based DNN (Deep Neural Network) accelerators. Leveraging the statistical properties of DNN output, our method called Online Batch-Norm Correction (OBNC) can compensate for the effect of programming and other variability on RCA output without using on-chip training or an iterative procedure, and is thus very fast. Also our method does not require a nonideality model or a training dataset, hence very easy to apply. Our experimental results using ternary neural networks with binary and 4-bit activations demonstrate that our OBNC can recover the baseline performance in many variability settings and that our method outperforms a previously known method (VCAM) by large margins when input distribution is asymmetric or activation is multi-bit.","PeriodicalId":154014,"journal":{"name":"2021 IEEE 39th International Conference on Computer Design (ICCD)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Fast and Low-Cost Mitigation of ReRAM Variability for Deep Learning Applications\",\"authors\":\"Sugil Lee, M. Fouda, Jongeun Lee, A. Eltawil, Fadi J. Kurdahi\",\"doi\":\"10.1109/ICCD53106.2021.00051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To overcome the programming variability (PV) of ReRAM crossbar arrays (RCAs), the most common method is program-verify, which, however, has high energy and latency overhead. In this paper we propose a very fast and low-cost method to mitigate the effect of PV and other variability for RCA-based DNN (Deep Neural Network) accelerators. Leveraging the statistical properties of DNN output, our method called Online Batch-Norm Correction (OBNC) can compensate for the effect of programming and other variability on RCA output without using on-chip training or an iterative procedure, and is thus very fast. Also our method does not require a nonideality model or a training dataset, hence very easy to apply. Our experimental results using ternary neural networks with binary and 4-bit activations demonstrate that our OBNC can recover the baseline performance in many variability settings and that our method outperforms a previously known method (VCAM) by large margins when input distribution is asymmetric or activation is multi-bit.\",\"PeriodicalId\":154014,\"journal\":{\"name\":\"2021 IEEE 39th International Conference on Computer Design (ICCD)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 39th International Conference on Computer Design (ICCD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD53106.2021.00051\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 39th International Conference on Computer Design (ICCD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD53106.2021.00051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fast and Low-Cost Mitigation of ReRAM Variability for Deep Learning Applications
To overcome the programming variability (PV) of ReRAM crossbar arrays (RCAs), the most common method is program-verify, which, however, has high energy and latency overhead. In this paper we propose a very fast and low-cost method to mitigate the effect of PV and other variability for RCA-based DNN (Deep Neural Network) accelerators. Leveraging the statistical properties of DNN output, our method called Online Batch-Norm Correction (OBNC) can compensate for the effect of programming and other variability on RCA output without using on-chip training or an iterative procedure, and is thus very fast. Also our method does not require a nonideality model or a training dataset, hence very easy to apply. Our experimental results using ternary neural networks with binary and 4-bit activations demonstrate that our OBNC can recover the baseline performance in many variability settings and that our method outperforms a previously known method (VCAM) by large margins when input distribution is asymmetric or activation is multi-bit.