{"title":"开发一个分班考试，以提高学生在初级电路和系统课上的成功","authors":"D. Parent","doi":"10.1109/FIE.2018.8659185","DOIUrl":null,"url":null,"abstract":"In this work, which is intended to be a Full Paper in the Innovative Practice Category, the implementation of an improved placement exam that increased the pass rate in a junior level systems course in the author’s electrical engineering department by 15% is presented. For almost 30 years the author’s EE department has used a face to face exam to place students in a junior level circuits and systems course or into a review workshop. The details of the exam and suggestions about future use in conjunction MyOpenMath analytics to increase student success are also given.","PeriodicalId":354904,"journal":{"name":"2018 IEEE Frontiers in Education Conference (FIE)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Development of a placement exam to increase student success in a junior level circuits and systems class\",\"authors\":\"D. Parent\",\"doi\":\"10.1109/FIE.2018.8659185\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, which is intended to be a Full Paper in the Innovative Practice Category, the implementation of an improved placement exam that increased the pass rate in a junior level systems course in the author’s electrical engineering department by 15% is presented. For almost 30 years the author’s EE department has used a face to face exam to place students in a junior level circuits and systems course or into a review workshop. The details of the exam and suggestions about future use in conjunction MyOpenMath analytics to increase student success are also given.\",\"PeriodicalId\":354904,\"journal\":{\"name\":\"2018 IEEE Frontiers in Education Conference (FIE)\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Frontiers in Education Conference (FIE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FIE.2018.8659185\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Frontiers in Education Conference (FIE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FIE.2018.8659185","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of a placement exam to increase student success in a junior level circuits and systems class
In this work, which is intended to be a Full Paper in the Innovative Practice Category, the implementation of an improved placement exam that increased the pass rate in a junior level systems course in the author’s electrical engineering department by 15% is presented. For almost 30 years the author’s EE department has used a face to face exam to place students in a junior level circuits and systems course or into a review workshop. The details of the exam and suggestions about future use in conjunction MyOpenMath analytics to increase student success are also given.
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