用表面标记光栅法定量分析柔性薄膜的表面弯曲应变

A. Shishido
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引用次数: 0

摘要

采用单纳米分辨率的表面标记光栅法定量分析了各种柔性薄膜的表面弯曲应变。我们实现的实时应变分析具有多种优点:高分辨率,精度和广泛的可测量材料。利用修正的弹性理论证实了测量结果的可靠性。结果表明,无论薄膜厚度和曲率如何,当表面应变超过1.45%时,硬质涂层都会发生开裂。两层PET层之间有一层柔软的PDMS层,与单层膜相同厚度相比,其表面弯曲应变降低了50%。该三层膜成功地抑制了硬质涂层的开裂和OTFT的击穿。因此,表面标记光栅法是一种实用的工具,可以分析精心设计的材料的表面弯曲应变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quantitative surface bending strain analysis of flexible films by surface labeled grating method
Surface bending strains in various flexible films is quantitatively analyzed by a surface-labeled grating method with a single-nanometer resolution. The real-time strain analysis we achieved has multiple benefits: high resolution, precision, and a wide range of measurable materials. The reliability of the measurements was confirmed using the modified Elastica theory. This method revealed that the cracking of hard coatings on the surface of PET films occurred at surface strains exceeding 1.45%, regardless of the film thickness and curvature. The multilayering of two PET layers with a soft PDMS layer between them reduced the surface bending strain by 50% compared with that of a single-layer film with the same thickness. This triple-layer film successfully suppressed the cracking of the hard coating and the breakdown of the OTFT. The surface-labeled grating method, therefore, is a practical tool that allows the analysis of surface bending strain in the elaborately designed materials.
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