B. Deveautour, A. Virazel, P. Girard, S. Pravossoudovitch, V. Gherman
{"title":"近似计算适用于算术电路的选择性硬化吗?","authors":"B. Deveautour, A. Virazel, P. Girard, S. Pravossoudovitch, V. Gherman","doi":"10.1109/DTIS.2018.8368559","DOIUrl":null,"url":null,"abstract":"Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. In this paper, we address the problem of selective hardening of arithmetic circuits by considering a duplication/comparison scheme as error detection architecture. Different duplication scenarios have been investigated: i) a full duplication, ii) a reduced duplication based on a structural susceptibility analysis, iii) a reduced duplication based on the logical weight of the arithmetic circuit outputs and iv) a reduced duplication based on an approximated structure from a public benchmark suite. Experimental results performed on adder and multiplier case study circuits demonstrate the interest of using approximate circuits to improve the mean time to failure while keeping a low area and power overhead and reduced error probability and error magnitude.","PeriodicalId":328650,"journal":{"name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Is aproximate computing suitable for selective hardening of arithmetic circuits?\",\"authors\":\"B. Deveautour, A. Virazel, P. Girard, S. Pravossoudovitch, V. Gherman\",\"doi\":\"10.1109/DTIS.2018.8368559\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. In this paper, we address the problem of selective hardening of arithmetic circuits by considering a duplication/comparison scheme as error detection architecture. Different duplication scenarios have been investigated: i) a full duplication, ii) a reduced duplication based on a structural susceptibility analysis, iii) a reduced duplication based on the logical weight of the arithmetic circuit outputs and iv) a reduced duplication based on an approximated structure from a public benchmark suite. Experimental results performed on adder and multiplier case study circuits demonstrate the interest of using approximate circuits to improve the mean time to failure while keeping a low area and power overhead and reduced error probability and error magnitude.\",\"PeriodicalId\":328650,\"journal\":{\"name\":\"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DTIS.2018.8368559\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2018.8368559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Is aproximate computing suitable for selective hardening of arithmetic circuits?
Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. In this paper, we address the problem of selective hardening of arithmetic circuits by considering a duplication/comparison scheme as error detection architecture. Different duplication scenarios have been investigated: i) a full duplication, ii) a reduced duplication based on a structural susceptibility analysis, iii) a reduced duplication based on the logical weight of the arithmetic circuit outputs and iv) a reduced duplication based on an approximated structure from a public benchmark suite. Experimental results performed on adder and multiplier case study circuits demonstrate the interest of using approximate circuits to improve the mean time to failure while keeping a low area and power overhead and reduced error probability and error magnitude.