{"title":"为特定于应用程序的内存建模","authors":"D.V. Das, R. Kumar, M. Lauria","doi":"10.1109/MTDT.1995.518075","DOIUrl":null,"url":null,"abstract":"Manufacturers' data sheets express the functionality of memory devices using timing diagrams. The relative time ordering of events can easily be captured in a Hasse diagram, which can then be used as a suitable model to automate behavioral model development.","PeriodicalId":318070,"journal":{"name":"Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Modeling application specific memories\",\"authors\":\"D.V. Das, R. Kumar, M. Lauria\",\"doi\":\"10.1109/MTDT.1995.518075\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Manufacturers' data sheets express the functionality of memory devices using timing diagrams. The relative time ordering of events can easily be captured in a Hasse diagram, which can then be used as a suitable model to automate behavioral model development.\",\"PeriodicalId\":318070,\"journal\":{\"name\":\"Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.1995.518075\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1995.518075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Manufacturers' data sheets express the functionality of memory devices using timing diagrams. The relative time ordering of events can easily be captured in a Hasse diagram, which can then be used as a suitable model to automate behavioral model development.