确定SiC镜面目标TIF深度的初始抛光机控制模型(会议报告)

Jeong-Yeol Han, Suyeon Cha, Dohoon Kim, M. Cho
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引用次数: 0

摘要

由于碳化硅材料的高韧性,一般来说,碳化硅镜面的抛光时间一直是光学工作者难以确定的。在光学车间,光学师通常在抛光镜面之前将输入参数输入到抛光机中。由光学师指定的目标表面去除率在很大程度上取决于抛光进度。非常紧张的抛光时间表通常会给验光师带来更大的目标数量。然而,目标数应由机器输入参数与输出去除率之间关系的可靠性来确定。本文介绍了一种能够可靠地给出抛光头机器输入参数的初始模型。这些参数可以控制抛光过程,以达到目标TIF (Tool Influence Function,工具影响函数)深度,该深度是SiC镜面光学表面的单位抛光去除量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Initial polishing machine control model to determine target TIF depth on SiC mirror surfaces (Conference Presentation)
Due to the high toughness of SiC material, in general, the polishing time of a SiC mirror has been challenging to determine by optician. In the optical shop, optician normally enters input parameters into a polishing machine prior to polish out the mirror surface. The target surface removal rate, specified by an optician, are highly depending on polishing schedule. A very tight polishing schedule commonly thrusts adventurous larger target quantities on the optician. However, the target numbers should be determined by the reliability of relationships between the machine input parameter and output removal rate. In this paper, we introduce an initial model which can reliably suggest machine input parameters for polishing head. These parameters can control polishing processes to achieve the target TIF (Tool Influence Function) depth which is an unit polishing removal quantity on the SiC mirror optical surfaces.
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