{"title":"地面辐射对数据中心fpga的影响","authors":"Andrew M. Keller, M. Wirthlin","doi":"10.1145/3457198","DOIUrl":null,"url":null,"abstract":"Field programmable gate arrays (FPGAs) are used in large numbers in data centers around the world. They are used for cloud computing and computer networking. The most common type of FPGA used in data centers are re-programmable SRAM-based FPGAs. These devices offer potential performance and power consumption savings. A single device also carries a small susceptibility to radiation-induced soft errors, which can lead to unexpected behavior. This article examines the impact of terrestrial radiation on FPGAs in data centers. Results from artificial fault injection and accelerated radiation testing on several data-center-like FPGA applications are compared. A new fault injection scheme provides results that are more similar to radiation testing. Silent data corruption (SDC) is the most commonly observed failure mode followed by FPGA unavailable and host unresponsive. A hypothetical deployment of 100,000 FPGAs in Denver, Colorado, will experience upsets in configuration memory every half-hour on average and SDC failures every 0.5–11 days on average.","PeriodicalId":162787,"journal":{"name":"ACM Transactions on Reconfigurable Technology and Systems (TRETS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The Impact of Terrestrial Radiation on FPGAs in Data Centers\",\"authors\":\"Andrew M. Keller, M. Wirthlin\",\"doi\":\"10.1145/3457198\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field programmable gate arrays (FPGAs) are used in large numbers in data centers around the world. They are used for cloud computing and computer networking. The most common type of FPGA used in data centers are re-programmable SRAM-based FPGAs. These devices offer potential performance and power consumption savings. A single device also carries a small susceptibility to radiation-induced soft errors, which can lead to unexpected behavior. This article examines the impact of terrestrial radiation on FPGAs in data centers. Results from artificial fault injection and accelerated radiation testing on several data-center-like FPGA applications are compared. A new fault injection scheme provides results that are more similar to radiation testing. Silent data corruption (SDC) is the most commonly observed failure mode followed by FPGA unavailable and host unresponsive. A hypothetical deployment of 100,000 FPGAs in Denver, Colorado, will experience upsets in configuration memory every half-hour on average and SDC failures every 0.5–11 days on average.\",\"PeriodicalId\":162787,\"journal\":{\"name\":\"ACM Transactions on Reconfigurable Technology and Systems (TRETS)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM Transactions on Reconfigurable Technology and Systems (TRETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3457198\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Transactions on Reconfigurable Technology and Systems (TRETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3457198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Impact of Terrestrial Radiation on FPGAs in Data Centers
Field programmable gate arrays (FPGAs) are used in large numbers in data centers around the world. They are used for cloud computing and computer networking. The most common type of FPGA used in data centers are re-programmable SRAM-based FPGAs. These devices offer potential performance and power consumption savings. A single device also carries a small susceptibility to radiation-induced soft errors, which can lead to unexpected behavior. This article examines the impact of terrestrial radiation on FPGAs in data centers. Results from artificial fault injection and accelerated radiation testing on several data-center-like FPGA applications are compared. A new fault injection scheme provides results that are more similar to radiation testing. Silent data corruption (SDC) is the most commonly observed failure mode followed by FPGA unavailable and host unresponsive. A hypothetical deployment of 100,000 FPGAs in Denver, Colorado, will experience upsets in configuration memory every half-hour on average and SDC failures every 0.5–11 days on average.