AIM LWIR和VLWIR MCT二维焦平面探测器阵列的最新技术,用于更高的工作温度

H. Figgemeier, S. Hanna, D. Eich, K. Mahlein, W. Fick, W. Schirmacher, R. Thöt
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引用次数: 3

摘要

本文介绍了AIM在n-on-p和p-on-n低暗电流平面MCT光电二极管技术LWIR和VLWIR二维焦平面探测器阵列上的最新研究成果,该阵列在80K下截止波长>11μm,在20μm间距下为640x512像素格式。与“Tennant规则07”相比,热暗电流显著降低,检测效率>60%,并且给出了NETD和光响应性能表征的结果。所展示的探测器性能为新一代更高工作温度的LWIR MCT fpa铺平了道路,其NETD <30mK,检测器工作温度高达110K,具有良好的可操作性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
State of the art of AIM LWIR and VLWIR MCT 2D focal plane detector arrays for higher operating temperatures
In this paper AIM presents its latest results on both n-on-p and p-on-n low dark current planar MCT photodiode technology LWIR and VLWIR two-dimensional focal plane detector arrays with a cut-off wavelength >11μm at 80K and a 640x512 pixel format at a 20μm pitch. Thermal dark currents significantly reduced as compared to ‘Tennant’s Rule 07’ at a yet good detection efficiency >60% as well as results from NETD and photo response performance characterization are presented. The demonstrated detector performance paces the way for a new generation of higher operating temperature LWIR MCT FPAs with a <30mK NETD up to a 110K detector operating temperature and with good operability.
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