T. Ohara, M. Abe, S. Wakana, M. Kishi, M. Tsuchiya, S. Kawasaki
{"title":"带通滤波器或光子带隙结构微带线二维场映射的光纤光电光谱分析系统","authors":"T. Ohara, M. Abe, S. Wakana, M. Kishi, M. Tsuchiya, S. Kawasaki","doi":"10.1109/MWP.2000.889825","DOIUrl":null,"url":null,"abstract":"An electrooptic spectrum analysis system, containing fiber optics only, was applied for the first time to electric field mapping. The devices under test (DUT) were microstrip lines having a band pass filter or a 2D photonic bandgap structure.","PeriodicalId":354312,"journal":{"name":"International Topical Meeting on Microwave Photonics MWP 2000 (Cat. No.00EX430)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Two-dimensional field mapping of microstrip lines with a band pass filter or a photonic bandgap structure by fiber-optic EO spectrum analysis system\",\"authors\":\"T. Ohara, M. Abe, S. Wakana, M. Kishi, M. Tsuchiya, S. Kawasaki\",\"doi\":\"10.1109/MWP.2000.889825\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An electrooptic spectrum analysis system, containing fiber optics only, was applied for the first time to electric field mapping. The devices under test (DUT) were microstrip lines having a band pass filter or a 2D photonic bandgap structure.\",\"PeriodicalId\":354312,\"journal\":{\"name\":\"International Topical Meeting on Microwave Photonics MWP 2000 (Cat. No.00EX430)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Topical Meeting on Microwave Photonics MWP 2000 (Cat. No.00EX430)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWP.2000.889825\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Topical Meeting on Microwave Photonics MWP 2000 (Cat. No.00EX430)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.2000.889825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Two-dimensional field mapping of microstrip lines with a band pass filter or a photonic bandgap structure by fiber-optic EO spectrum analysis system
An electrooptic spectrum analysis system, containing fiber optics only, was applied for the first time to electric field mapping. The devices under test (DUT) were microstrip lines having a band pass filter or a 2D photonic bandgap structure.