{"title":"新型低成本老化传感器","authors":"M. Omaña, Daniele Rossi, N. Bosio, C. Metra","doi":"10.1145/1787275.1787299","DOIUrl":null,"url":null,"abstract":"Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.","PeriodicalId":151791,"journal":{"name":"Proceedings of the 7th ACM international conference on Computing frontiers","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Novel low-cost aging sensor\",\"authors\":\"M. Omaña, Daniele Rossi, N. Bosio, C. Metra\",\"doi\":\"10.1145/1787275.1787299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.\",\"PeriodicalId\":151791,\"journal\":{\"name\":\"Proceedings of the 7th ACM international conference on Computing frontiers\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 7th ACM international conference on Computing frontiers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1787275.1787299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 7th ACM international conference on Computing frontiers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1787275.1787299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.
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