R. Hattori, G. Nakamura, S. Nomura, T. Ichise, A. Masuda, H. Matsumura
{"title":"催化气相沉积法钝化phemt的降噪研究","authors":"R. Hattori, G. Nakamura, S. Nomura, T. Ichise, A. Masuda, H. Matsumura","doi":"10.1109/GAAS.1997.628242","DOIUrl":null,"url":null,"abstract":"We improved the catalytic (cat-) CVD technique for damage free passivation on compound semiconductors. The cat-CVD SiN passivation successfully reduces the noise figure of X-band pHEMTs because Rs and Cgs are reduced due to low deposition damage.","PeriodicalId":299287,"journal":{"name":"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Noise reduction of pHEMTs with plasmaless SiN passivation by catalytic CVD\",\"authors\":\"R. Hattori, G. Nakamura, S. Nomura, T. Ichise, A. Masuda, H. Matsumura\",\"doi\":\"10.1109/GAAS.1997.628242\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We improved the catalytic (cat-) CVD technique for damage free passivation on compound semiconductors. The cat-CVD SiN passivation successfully reduces the noise figure of X-band pHEMTs because Rs and Cgs are reduced due to low deposition damage.\",\"PeriodicalId\":299287,\"journal\":{\"name\":\"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997\",\"volume\":\"136 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GAAS.1997.628242\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.1997.628242","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Noise reduction of pHEMTs with plasmaless SiN passivation by catalytic CVD
We improved the catalytic (cat-) CVD technique for damage free passivation on compound semiconductors. The cat-CVD SiN passivation successfully reduces the noise figure of X-band pHEMTs because Rs and Cgs are reduced due to low deposition damage.