Random Data Generation from Thermal Noise with Variable Probability

In this paper, an approach for generation of truly random data with hardware circuitry from thermal noise is presented. A circuit is simulated to give truly random data at the output. A new method for generating random data with desired probabilities of logic low and logic high is presented with modification in the designed circuit. Individual blocks of the circuit are discussed in detail. The truly random data is obtained and the probabilities of either logic are verified to be equal. Thereafter, the variation of probability of occurrence of logic low is illustrated with variable voltage decided by the user. The randomness of generated output data is studied in both cases and the applicability of thermal noise is verified.