{"title":"一种检测失效(短路)瞬态电压抑制器以确定破坏性脉冲特性的方法","authors":"A. D. Smith, J.R. Lightsey, R. W. Hudson","doi":"10.1109/NSEMC.1989.37163","DOIUrl":null,"url":null,"abstract":"A method is described for estimating the characteristics of pulses which were destroying transient voltage suppression (TVS) devices onboard the B-52 bomber aircraft. The method relies entirely on an analysis of the physical damage done to serviceable TVS devices in the laboratory under controlled conditions. A photographic record was made and then compared to the field-damaged and laboratory-damaged devices. If the physical appearances of the TVS devices damaged in the lab and in the field were identical, it was thought most likely that they were damaged by approximately the same type of pulse.<<ETX>>","PeriodicalId":408694,"journal":{"name":"National Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A method for examining failed (shorted) transient voltage suppressors to determine the destructive pulse characteristics\",\"authors\":\"A. D. Smith, J.R. Lightsey, R. W. Hudson\",\"doi\":\"10.1109/NSEMC.1989.37163\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method is described for estimating the characteristics of pulses which were destroying transient voltage suppression (TVS) devices onboard the B-52 bomber aircraft. The method relies entirely on an analysis of the physical damage done to serviceable TVS devices in the laboratory under controlled conditions. A photographic record was made and then compared to the field-damaged and laboratory-damaged devices. If the physical appearances of the TVS devices damaged in the lab and in the field were identical, it was thought most likely that they were damaged by approximately the same type of pulse.<<ETX>>\",\"PeriodicalId\":408694,\"journal\":{\"name\":\"National Symposium on Electromagnetic Compatibility\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"National Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSEMC.1989.37163\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"National Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSEMC.1989.37163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method for examining failed (shorted) transient voltage suppressors to determine the destructive pulse characteristics
A method is described for estimating the characteristics of pulses which were destroying transient voltage suppression (TVS) devices onboard the B-52 bomber aircraft. The method relies entirely on an analysis of the physical damage done to serviceable TVS devices in the laboratory under controlled conditions. A photographic record was made and then compared to the field-damaged and laboratory-damaged devices. If the physical appearances of the TVS devices damaged in the lab and in the field were identical, it was thought most likely that they were damaged by approximately the same type of pulse.<>
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