x波段无损裂纹检测

International Conference on Electronics, Communication and Instrumentation (ICECI) Pub Date : 2014-03-17 DOI:10.1109/ICECI.2014.6767371

P. Das, S. B. Belamgi, S. Ray

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引用次数: 1

摘要

无损检测技术是微波领域研究人员最具挑战性的领域之一。本文研究了利用开放式t结传感器在x波段对金属表面矩形孔三维裂纹进行检测。与其他已报道的微波无损检测技术相比，该技术显示出更好的分辨率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Non destructive crack detection at X-band

Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.

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International Conference on Electronics, Communication and Instrumentation (ICECI)

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