{"title":"适用于100t以上破坏性磁铁的非接触式超高频交流电导率测量","authors":"D. Nakamura, A. Ikeda, Y. Matsuda, S. Takeyama","doi":"10.1109/MEGAGAUSS.2018.8722657","DOIUrl":null,"url":null,"abstract":"The contactless high-frequency electrical conductivity measurement using a “self-resonant” probe coil was performed under the ultra-high magnetic fields generated by the destructive magnets, and applied to measure the upper critical field of the cuprate superconductor La1.84Sr0.16CuO4, and also applied to observe a semiconductor-metal transition of the narrow gap semiconductor FeSi.","PeriodicalId":207949,"journal":{"name":"2018 16th International Conference on Megagauss Magnetic Field Generation and Related Topics (MEGAGAUSS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Contactless ultra-high frequency AC-conductivity measurement applicable to destructive magnets above 100 T\",\"authors\":\"D. Nakamura, A. Ikeda, Y. Matsuda, S. Takeyama\",\"doi\":\"10.1109/MEGAGAUSS.2018.8722657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The contactless high-frequency electrical conductivity measurement using a “self-resonant” probe coil was performed under the ultra-high magnetic fields generated by the destructive magnets, and applied to measure the upper critical field of the cuprate superconductor La1.84Sr0.16CuO4, and also applied to observe a semiconductor-metal transition of the narrow gap semiconductor FeSi.\",\"PeriodicalId\":207949,\"journal\":{\"name\":\"2018 16th International Conference on Megagauss Magnetic Field Generation and Related Topics (MEGAGAUSS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 16th International Conference on Megagauss Magnetic Field Generation and Related Topics (MEGAGAUSS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEGAGAUSS.2018.8722657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 16th International Conference on Megagauss Magnetic Field Generation and Related Topics (MEGAGAUSS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEGAGAUSS.2018.8722657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Contactless ultra-high frequency AC-conductivity measurement applicable to destructive magnets above 100 T
The contactless high-frequency electrical conductivity measurement using a “self-resonant” probe coil was performed under the ultra-high magnetic fields generated by the destructive magnets, and applied to measure the upper critical field of the cuprate superconductor La1.84Sr0.16CuO4, and also applied to observe a semiconductor-metal transition of the narrow gap semiconductor FeSi.