{"title":"6ghz范围SAW标签和传感器","authors":"V. Plessky, S. Suchkov, Z. Davis, M. Lamothe","doi":"10.1109/EFTF.2014.7331451","DOIUrl":null,"url":null,"abstract":"The feasibility of using 6 GHz frequencies for passive SAW-tags and sensors type devices is demonstrated. An example of the in-line 6 GHz SAW tag design is presented. Supposing that Ultra-Wide-frequency Band (UWB, B=775MHz) can be used, the tag dimensions can be significantly reduced and the loss of reflected response remains at an acceptable level of approximately 50dB. The SAW-tags and sensor test device has been manufactured using E-beam lithography and Nano-Imprint technology and demonstrate performance close to predicted, including the loss level of approximately 55dB. The possibility of high throughput manufacturing by combining Nano-Imprint and E-beam Lithography (NIL) is discussed. SAW sensor test devices produced using NIL are demonstrated.","PeriodicalId":129873,"journal":{"name":"2014 European Frequency and Time Forum (EFTF)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"6 GHz range SAW tags and sensors\",\"authors\":\"V. Plessky, S. Suchkov, Z. Davis, M. Lamothe\",\"doi\":\"10.1109/EFTF.2014.7331451\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The feasibility of using 6 GHz frequencies for passive SAW-tags and sensors type devices is demonstrated. An example of the in-line 6 GHz SAW tag design is presented. Supposing that Ultra-Wide-frequency Band (UWB, B=775MHz) can be used, the tag dimensions can be significantly reduced and the loss of reflected response remains at an acceptable level of approximately 50dB. The SAW-tags and sensor test device has been manufactured using E-beam lithography and Nano-Imprint technology and demonstrate performance close to predicted, including the loss level of approximately 55dB. The possibility of high throughput manufacturing by combining Nano-Imprint and E-beam Lithography (NIL) is discussed. SAW sensor test devices produced using NIL are demonstrated.\",\"PeriodicalId\":129873,\"journal\":{\"name\":\"2014 European Frequency and Time Forum (EFTF)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 European Frequency and Time Forum (EFTF)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EFTF.2014.7331451\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 European Frequency and Time Forum (EFTF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EFTF.2014.7331451","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The feasibility of using 6 GHz frequencies for passive SAW-tags and sensors type devices is demonstrated. An example of the in-line 6 GHz SAW tag design is presented. Supposing that Ultra-Wide-frequency Band (UWB, B=775MHz) can be used, the tag dimensions can be significantly reduced and the loss of reflected response remains at an acceptable level of approximately 50dB. The SAW-tags and sensor test device has been manufactured using E-beam lithography and Nano-Imprint technology and demonstrate performance close to predicted, including the loss level of approximately 55dB. The possibility of high throughput manufacturing by combining Nano-Imprint and E-beam Lithography (NIL) is discussed. SAW sensor test devices produced using NIL are demonstrated.
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