{"title":"测量阻抗传感器参数的微系统","authors":"J. Hoja, G. Lentka","doi":"10.1117/12.517130","DOIUrl":null,"url":null,"abstract":"The paper presents a measurement microsystem of parameters of impedance sensors characterized by impedance modulus in the range of 100Ω÷1GΩ. A wide frequency range (100μHz÷1MHz), especially at very low frequencies, has been achieved by the use of the DSP (Digital Signal Processing) technique. The simple construction assures low cost of the microsystem. The form of a virtual instrument has been used; the measurement module is connected via RS-232 interface to a personal computer. This solution allows using the microsystem to impedance spectroscopy of newly-developed sensors but also leads to a realization of dedicated microsystem with own display. The measurement error of impedance modulus and phase has been determined in relation to measurement frequency and measured impedance.","PeriodicalId":405495,"journal":{"name":"Optoelectronic and Electronic Sensors","volume":"352 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microsystem for measurement of impedance sensors parameters\",\"authors\":\"J. Hoja, G. Lentka\",\"doi\":\"10.1117/12.517130\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a measurement microsystem of parameters of impedance sensors characterized by impedance modulus in the range of 100Ω÷1GΩ. A wide frequency range (100μHz÷1MHz), especially at very low frequencies, has been achieved by the use of the DSP (Digital Signal Processing) technique. The simple construction assures low cost of the microsystem. The form of a virtual instrument has been used; the measurement module is connected via RS-232 interface to a personal computer. This solution allows using the microsystem to impedance spectroscopy of newly-developed sensors but also leads to a realization of dedicated microsystem with own display. The measurement error of impedance modulus and phase has been determined in relation to measurement frequency and measured impedance.\",\"PeriodicalId\":405495,\"journal\":{\"name\":\"Optoelectronic and Electronic Sensors\",\"volume\":\"352 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optoelectronic and Electronic Sensors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.517130\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optoelectronic and Electronic Sensors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.517130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microsystem for measurement of impedance sensors parameters
The paper presents a measurement microsystem of parameters of impedance sensors characterized by impedance modulus in the range of 100Ω÷1GΩ. A wide frequency range (100μHz÷1MHz), especially at very low frequencies, has been achieved by the use of the DSP (Digital Signal Processing) technique. The simple construction assures low cost of the microsystem. The form of a virtual instrument has been used; the measurement module is connected via RS-232 interface to a personal computer. This solution allows using the microsystem to impedance spectroscopy of newly-developed sensors but also leads to a realization of dedicated microsystem with own display. The measurement error of impedance modulus and phase has been determined in relation to measurement frequency and measured impedance.