基于光敏BCB非均质集成封装功率放大器的热力学分析

Rong-Liang Cai, Cheng-rui Zhang, Liang Zhou
{"title":"基于光敏BCB非均质集成封装功率放大器的热力学分析","authors":"Rong-Liang Cai, Cheng-rui Zhang, Liang Zhou","doi":"10.1109/EDAPS.2016.7893117","DOIUrl":null,"url":null,"abstract":"This study demonstrated the fabrication integration process of two cascaded GaAs MMICs using BCB films in order to achieve heterogeneous integration. Thermal-mechanical analysis has been simulated and performed to investigate the distributions of the temperature and stress. It has been found that the maximum temperature in the packaging depended on the dissipated power of the RF medium power amplifier. Although the temperature would not exceed the channel temperature of the dies in this case, the materials may also exceed their yield strength which will cause the reliability issues. This research will help to understand significant thermal and mechanical issues of high density IC packaging.","PeriodicalId":191549,"journal":{"name":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Thermal-mechanical analysis of packaged power amplifiers based on heterogeneous integrations using photosensitive BCB\",\"authors\":\"Rong-Liang Cai, Cheng-rui Zhang, Liang Zhou\",\"doi\":\"10.1109/EDAPS.2016.7893117\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This study demonstrated the fabrication integration process of two cascaded GaAs MMICs using BCB films in order to achieve heterogeneous integration. Thermal-mechanical analysis has been simulated and performed to investigate the distributions of the temperature and stress. It has been found that the maximum temperature in the packaging depended on the dissipated power of the RF medium power amplifier. Although the temperature would not exceed the channel temperature of the dies in this case, the materials may also exceed their yield strength which will cause the reliability issues. This research will help to understand significant thermal and mechanical issues of high density IC packaging.\",\"PeriodicalId\":191549,\"journal\":{\"name\":\"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2016.7893117\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2016.7893117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本研究演示了利用BCB薄膜制备两个级联GaAs mmic的集成过程,以实现异质集成。通过模拟热力学分析来研究温度和应力的分布。研究发现,射频中功率放大器封装的最高温度取决于其耗散功率。虽然在这种情况下温度不会超过模具的通道温度,但材料也可能超过其屈服强度,这将导致可靠性问题。这项研究将有助于了解高密度集成电路封装的重要热学和机械问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermal-mechanical analysis of packaged power amplifiers based on heterogeneous integrations using photosensitive BCB
This study demonstrated the fabrication integration process of two cascaded GaAs MMICs using BCB films in order to achieve heterogeneous integration. Thermal-mechanical analysis has been simulated and performed to investigate the distributions of the temperature and stress. It has been found that the maximum temperature in the packaging depended on the dissipated power of the RF medium power amplifier. Although the temperature would not exceed the channel temperature of the dies in this case, the materials may also exceed their yield strength which will cause the reliability issues. This research will help to understand significant thermal and mechanical issues of high density IC packaging.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信