基于散斑数字图像相关的微变形测量误差分析

2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2012-08-01 DOI:10.1109/3M-NANO.2012.6472959

Zhong Chen, Xianmin Zhang, Xiaofeng Zhou

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引用次数: 0

摘要

散斑数字图像相关(DIC)方法已将其应用范围从微尺度和宏观尺度扩展到纳米尺度的微变形测量。由于DIC方法的微变形误差主要取决于其参数的正确选择和硬件设置，因此需要详细阐明关键参数以及这些参数对测量精度的影响。考虑到纳米尺度微变形测量实验设置的困难，在变形模拟实验和实际拉伸试验中，对DIC方法在不同参数条件下的微变形测量误差进行了评价，并提出了一些建议。

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Analysis of measuring errors of micro-deformation using speckle digital image correlation

Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the microdeformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.

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2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

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