基于时域技术的多层厚膜元件建模

1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI:10.1109/CPEM.1988.671373

A. Y. AlMazroo, J. Toscano, A. Elshabini-Riad

{"title":"基于时域技术的多层厚膜元件建模","authors":"A. Y. AlMazroo, J. Toscano, A. Elshabini-Riad","doi":"10.1109/CPEM.1988.671373","DOIUrl":null,"url":null,"abstract":"A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling of Multilayer Thick Film Components Using Time Domain Techniques\",\"authors\":\"A. Y. AlMazroo, J. Toscano, A. Elshabini-Riad\",\"doi\":\"10.1109/CPEM.1988.671373\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671373\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

提出了一种基于时域测量的多层厚膜构件建模技术。用一个多层电感来演示该技术，多层电感是由螺旋线圈垂直堆叠而成，中间有介电层。被测元件被置于参考线的末端，并获得TDR波形。开发了一个基于物理的模型来拟合TDR信息。

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Modeling of Multilayer Thick Film Components Using Time Domain Techniques

A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.

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1988 Conference on Precision Electromagnetic Measurements

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