嵌入式芯片电容的高信号完整性pcb走线及其遗传算法设计方法

M. Yasunaga, Shumpei Matsuoka, Yuya Hoshinor, Takashi Matsumoto, T. Odaira
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引用次数: 3

摘要

由于阻抗匹配设计的困难,印制电路板(pcb)在GHz频段的信号完整性(SI)退化问题日益严重。在本文中,我们提出了一种新型的走线结构电容器分段传输线(C-STL)及其设计方法来克服SI的退化问题。在C-STL中,我们有意通过连接在PCB中的走线或传输线上的嵌入式芯片电容产生反射波或阻抗不匹配引起的噪声,并将反射波叠加到失真的数字信号上,使其成为理想的数字信号。由于芯片-电容选择成为一个组合爆炸问题,我们采用遗传算法对C-STL进行设计。我们制作了一个C-STL原型,并通过眼图测量证明了它的高SI改进能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A High Signal-Integrity PCB-Trace with Embedded Chip Capacitors and Its Design Methodology Using Genetic Algorithm
Signal integrity (SI) degradation in printed circuit boards (PCBs) has been becoming more serious problem in GHz domain due to the difficulty of impedance matching designs. In this paper, we propose a novel trace structure called capacitor- segmental transmission line (C-STL) and its design methodology to overcome the SI degradation problem. In the C-STL, we intentionally generate reflection waves, or noises due to impedance mismatching by embedded chip capacitors connected to the trace, or transmission line in the PCB, and superpose the reflection waves onto the distorted digital signals to shape it to ideal ones. We use genetic algorithm to design the C-STL because chip-capacitor-selection becomes a combinatorial explosion problem. We fabricate a C-STL prototype and demonstrate its high SI improvement capability by eye-diagram measurements.
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