SAECP与定量图像分析相结合是一种改进的纹理分析工具

W. Lorenz, H. Hougardy
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引用次数: 1

摘要

用扫描电子显微镜可以获得选定区域的电子通道模式(SAECP),该模式可以确定抛光钢试样中单个晶粒的取向。总结了从测量图样中确定晶粒取向的不同方法。测定取向所需的最小晶粒直径约为7μm,测定(hkl)的最大误差约为2°,测定[uvw]的最大误差约为4°。测定400个晶粒的取向所需的总时间约为60小时。讨论了结果的不同表示形式。一个例子表明,单取向测量比单x射线研究能提供更多关于再结晶机理的信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SAECP Combined with Quantitative Image Analysis an Improved Tool for Texture Analysis
A selected area electron channelling pattern (SAECP), which allows the determination of the orientation of individual grains in polished steel specimens, can be obtained with a scanning electron microscope. The different methods to determine the orientation of the grains from the measured pattern are summarized. A minimum grain diameter of about 7μm is required for orientation determination and the maximum error for the determination of (hkl) is about 2°, and about 4° for [uvw]. The total time needed for the determination of the orientation of 400 grains is in the range of 60 hours. Different representations of results are discussed. An example shows that the measurement of single orientations can give more information on the mechanisms of recrystallization than an investigation by x-rays only.
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