{"title":"利用硅场发射成像阵列进行x射线能量探测","authors":"M. Wong, C. Hunt, Y. Diawara","doi":"10.1109/IVNC.2006.335412","DOIUrl":null,"url":null,"abstract":"In this paper, silicon field-emission imaging array tips were used for X-ray energy detection. The incident X-ray photon, depending on its photon energy and the material of the detector, will generate a specific number of electron/hole pairs (EHPs) and penetrate an energy-dependant distance into the substrate. The collected electron current generates a distinct pulse width and height, which correlates to the specific energy of the incident photon. The amplified pulses, unlike ordinary energy detectors, are spatially specific to the photon impact; therefore, this method produces both an imager and an energy detector. This capability is unavailable in any other X-ray imaging method and therefore, is valuable in X-ray diffractometric applications","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"46 Suppl 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"X-Ray Energy Detection Using Silicon Field Emission Imaging Array\",\"authors\":\"M. Wong, C. Hunt, Y. Diawara\",\"doi\":\"10.1109/IVNC.2006.335412\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, silicon field-emission imaging array tips were used for X-ray energy detection. The incident X-ray photon, depending on its photon energy and the material of the detector, will generate a specific number of electron/hole pairs (EHPs) and penetrate an energy-dependant distance into the substrate. The collected electron current generates a distinct pulse width and height, which correlates to the specific energy of the incident photon. The amplified pulses, unlike ordinary energy detectors, are spatially specific to the photon impact; therefore, this method produces both an imager and an energy detector. This capability is unavailable in any other X-ray imaging method and therefore, is valuable in X-ray diffractometric applications\",\"PeriodicalId\":108834,\"journal\":{\"name\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"volume\":\"46 Suppl 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2006.335412\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 19th International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2006.335412","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
X-Ray Energy Detection Using Silicon Field Emission Imaging Array
In this paper, silicon field-emission imaging array tips were used for X-ray energy detection. The incident X-ray photon, depending on its photon energy and the material of the detector, will generate a specific number of electron/hole pairs (EHPs) and penetrate an energy-dependant distance into the substrate. The collected electron current generates a distinct pulse width and height, which correlates to the specific energy of the incident photon. The amplified pulses, unlike ordinary energy detectors, are spatially specific to the photon impact; therefore, this method produces both an imager and an energy detector. This capability is unavailable in any other X-ray imaging method and therefore, is valuable in X-ray diffractometric applications