{"title":"GMR结构ESD破坏绝热模型的局限性","authors":"E. Granstrom, N. Tabat","doi":"10.1109/EOSESD.2000.890041","DOIUrl":null,"url":null,"abstract":"Patterned giant magnetoresistance (GMR) films resembling shield-less sensors with varying sizes have been subjected to simulated ESD. As sensor width decreases, the failure voltage for a modified human body model (150 /spl Omega/, 150 pF) passes through a minimum before sharply increasing for narrowest devices. In contrast to adiabatic predictions, smaller width devices (<0.75 /spl mu/m) become more robust to ESD due to the thermal conductance of the sensor contacts. These results should extend to GMR heads, and suggest that for longer ESD events, changes in sensor width for higher areal density recording may partially mitigate the trend towards greater ESD sensitivity.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Limitations of the adiabatic model for ESD failure in GMR structures\",\"authors\":\"E. Granstrom, N. Tabat\",\"doi\":\"10.1109/EOSESD.2000.890041\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Patterned giant magnetoresistance (GMR) films resembling shield-less sensors with varying sizes have been subjected to simulated ESD. As sensor width decreases, the failure voltage for a modified human body model (150 /spl Omega/, 150 pF) passes through a minimum before sharply increasing for narrowest devices. In contrast to adiabatic predictions, smaller width devices (<0.75 /spl mu/m) become more robust to ESD due to the thermal conductance of the sensor contacts. These results should extend to GMR heads, and suggest that for longer ESD events, changes in sensor width for higher areal density recording may partially mitigate the trend towards greater ESD sensitivity.\",\"PeriodicalId\":332394,\"journal\":{\"name\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2000.890041\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Limitations of the adiabatic model for ESD failure in GMR structures
Patterned giant magnetoresistance (GMR) films resembling shield-less sensors with varying sizes have been subjected to simulated ESD. As sensor width decreases, the failure voltage for a modified human body model (150 /spl Omega/, 150 pF) passes through a minimum before sharply increasing for narrowest devices. In contrast to adiabatic predictions, smaller width devices (<0.75 /spl mu/m) become more robust to ESD due to the thermal conductance of the sensor contacts. These results should extend to GMR heads, and suggest that for longer ESD events, changes in sensor width for higher areal density recording may partially mitigate the trend towards greater ESD sensitivity.