{"title":"微等离子体反应器中硅的SF6等离子体刻蚀及轮廓演变","authors":"Wang Hai, Li Han, Zhou Xuan, Wang Zhan, Wen Li","doi":"10.1109/NEMS.2013.6559936","DOIUrl":null,"url":null,"abstract":"Microplasma has been applied widely in micro- and nano-device fabrication. The etching performance and profile evolution are crucial for realization of Scanning Plasma Etching (SPE). In this work, silicon etching in SPE with microplasma reactor will be discussed through multi-fluid plasma model integrated with Monte Carlo model. The relationship between etching rate and tip-sample distance is discussed. The evolution of etched silicon profile is also investigated through simulation of feature diameter and etching depth with the time. The result of simulation will provide a foundation for optimization of operative conditions of SPE.","PeriodicalId":308928,"journal":{"name":"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems","volume":"58 14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SF6 plasma etching and profile evolution of silicon in microplasma reactor\",\"authors\":\"Wang Hai, Li Han, Zhou Xuan, Wang Zhan, Wen Li\",\"doi\":\"10.1109/NEMS.2013.6559936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microplasma has been applied widely in micro- and nano-device fabrication. The etching performance and profile evolution are crucial for realization of Scanning Plasma Etching (SPE). In this work, silicon etching in SPE with microplasma reactor will be discussed through multi-fluid plasma model integrated with Monte Carlo model. The relationship between etching rate and tip-sample distance is discussed. The evolution of etched silicon profile is also investigated through simulation of feature diameter and etching depth with the time. The result of simulation will provide a foundation for optimization of operative conditions of SPE.\",\"PeriodicalId\":308928,\"journal\":{\"name\":\"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems\",\"volume\":\"58 14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEMS.2013.6559936\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2013.6559936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SF6 plasma etching and profile evolution of silicon in microplasma reactor
Microplasma has been applied widely in micro- and nano-device fabrication. The etching performance and profile evolution are crucial for realization of Scanning Plasma Etching (SPE). In this work, silicon etching in SPE with microplasma reactor will be discussed through multi-fluid plasma model integrated with Monte Carlo model. The relationship between etching rate and tip-sample distance is discussed. The evolution of etched silicon profile is also investigated through simulation of feature diameter and etching depth with the time. The result of simulation will provide a foundation for optimization of operative conditions of SPE.