微等离子体反应器中硅的SF6等离子体刻蚀及轮廓演变

Wang Hai, Li Han, Zhou Xuan, Wang Zhan, Wen Li
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引用次数: 0

摘要

微等离子体在微纳米器件制造中有着广泛的应用。蚀刻性能和轮廓演变是实现扫描等离子体蚀刻(SPE)的关键。本文将多流体等离子体模型与蒙特卡罗模型相结合,讨论微等离子体反应器在SPE中蚀刻硅的过程。讨论了刻蚀速率与尖端样品距离的关系。通过模拟特征直径和刻蚀深度随时间的变化,研究了刻蚀硅轮廓的演变。模拟结果将为优化固相萃取的操作条件提供依据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SF6 plasma etching and profile evolution of silicon in microplasma reactor
Microplasma has been applied widely in micro- and nano-device fabrication. The etching performance and profile evolution are crucial for realization of Scanning Plasma Etching (SPE). In this work, silicon etching in SPE with microplasma reactor will be discussed through multi-fluid plasma model integrated with Monte Carlo model. The relationship between etching rate and tip-sample distance is discussed. The evolution of etched silicon profile is also investigated through simulation of feature diameter and etching depth with the time. The result of simulation will provide a foundation for optimization of operative conditions of SPE.
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