基于卫星的高速通道调试使用波形

M. Dehbashi, G. Fey
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引用次数: 6

摘要

高速通道调试是高性能VLSI电路设计中的一个重要问题。这是由于随着VLSI电路尺寸的缩小,由工艺变化和环境影响引起的时序变化正在增加。本文提出了一种基于布尔可满足性(SAT)的快速路径调试方法。该方法考虑了电路信号的波形。利用SAT对波形及其传播进行编码,并将各栅极的减速和加速时序变化模型纳入模型。整个时间变化是由一个称为变化控制的单元控制的。如果由于时间变化而出现错误跟踪(ET),我们的调试引擎会自动发现潜在的失败速度路径。在ISCAS基准上的实验结果表明了该方法的有效性和诊断准确性。该方法还可以对具有大量路径的乘法器电路c6288的潜在故障速度路径进行定位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sat-based speedpath debugging using waveforms
A major concern in the design of high performance VLSI circuits is speedpath debugging. This is due to the fact that timing variations induced by process variations and environmental effects are increasing as the size of VLSI circuits is shrinking. In this paper, a speedpath debugging approach based on Boolean Satisfiability (SAT) is proposed. The approach takes waveforms of the signals of a circuit into account. Waveforms and their propagation are encoded using SAT. Also, timing variation models for slowdown and speedup of each gate are incorporated into the model. The whole timing variation is controlled by a unit called variation control. Having an Erroneous Trace (ET) due to timing variation, our debug engine automatically finds potential failing speedpaths. The experimental results on ISCAS benchmarks show efficiency and diagnosis accuracy of our approach. The approach can also localize potential failing speedpaths for the multiplier circuit c6288 that has a large number of paths.
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