光折变系统中的基本噪声限制

F. Vachss, C. Gu, John H. Hong, T. Chang
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引用次数: 1

摘要

当光折变材料作为元件应用于图像和信号处理系统时,光折变元件的动态范围对系统的整体性能有着重要的影响。如果我们希望将光折变器件(如空间光调制器1,2或集成相关器3)与基于竞争光电技术的类似器件进行现实比较,那么评估该动态范围内的发射就特别重要。因此,我们必须确定可用于写入具有某种固定强度的参考光束的全息光栅的信号光束强度的范围,或者换句话说,将导致在光折变材料内写入可检测的折射率光栅的最大光束比。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fundamental Noise Limits in Photorefractive Systems
When photorefractive materials are included as elements in image and signal processing systems, the dynamic range of the photorefractive element has a significant impact on the overall performance of the system. Evaluating the Emits on this dynamic range is of particular importance if we hope to provide a realistic comparison of photorefractive devices such as spatial light modulators1,2 or integrating correlators 3 with similar devices based on competing opto-electronic technologies. We must thus determine the range of signal beam intensities which may be used to write a holographic grating with a reference beam of some fixed intensity, or in other words, the maximum beam ratio that will cause a detectable refractive index grating to be written within the photorefractive material.
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