{"title":"高压断路器状态参数测试仪的研究","authors":"Hu Xiaoguang, Lv Chao","doi":"10.1109/ICIEA.2008.4582945","DOIUrl":null,"url":null,"abstract":"In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.","PeriodicalId":309894,"journal":{"name":"2008 3rd IEEE Conference on Industrial Electronics and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Research on the condition parameter tester of high voltage circuit breakers\",\"authors\":\"Hu Xiaoguang, Lv Chao\",\"doi\":\"10.1109/ICIEA.2008.4582945\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.\",\"PeriodicalId\":309894,\"journal\":{\"name\":\"2008 3rd IEEE Conference on Industrial Electronics and Applications\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 3rd IEEE Conference on Industrial Electronics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIEA.2008.4582945\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 3rd IEEE Conference on Industrial Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIEA.2008.4582945","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research on the condition parameter tester of high voltage circuit breakers
In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
