Jason Chan, Brian Fehring, Roman W. Morse, Kristofer M. Dressler, G. Nellis, E. Hurlburt, A. Berson
{"title":"环空两相流热反射壁温测量","authors":"Jason Chan, Brian Fehring, Roman W. Morse, Kristofer M. Dressler, G. Nellis, E. Hurlburt, A. Berson","doi":"10.1115/icnmm2019-4249","DOIUrl":null,"url":null,"abstract":"\n A thermoreflectance method to measure wall temperature in two-phase annular flow is described. In high heat flux conditions, momentary dry-out occurs as the liquid film vaporizes, resulting in dramatic decreases in heat transfer coefficient. Simultaneous liquid and vapor thermoreflectance measurements allow calculations of instantaneous and time-averaged heat transfer coefficients. Validation, calibration and uncertainty of the technique are discussed.","PeriodicalId":221056,"journal":{"name":"ASME 2019 17th International Conference on Nanochannels, Microchannels, and Minichannels","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Thermoreflectance Wall Temperature Measurement in Annular Two-Phase Flow\",\"authors\":\"Jason Chan, Brian Fehring, Roman W. Morse, Kristofer M. Dressler, G. Nellis, E. Hurlburt, A. Berson\",\"doi\":\"10.1115/icnmm2019-4249\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n A thermoreflectance method to measure wall temperature in two-phase annular flow is described. In high heat flux conditions, momentary dry-out occurs as the liquid film vaporizes, resulting in dramatic decreases in heat transfer coefficient. Simultaneous liquid and vapor thermoreflectance measurements allow calculations of instantaneous and time-averaged heat transfer coefficients. Validation, calibration and uncertainty of the technique are discussed.\",\"PeriodicalId\":221056,\"journal\":{\"name\":\"ASME 2019 17th International Conference on Nanochannels, Microchannels, and Minichannels\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ASME 2019 17th International Conference on Nanochannels, Microchannels, and Minichannels\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1115/icnmm2019-4249\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME 2019 17th International Conference on Nanochannels, Microchannels, and Minichannels","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/icnmm2019-4249","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermoreflectance Wall Temperature Measurement in Annular Two-Phase Flow
A thermoreflectance method to measure wall temperature in two-phase annular flow is described. In high heat flux conditions, momentary dry-out occurs as the liquid film vaporizes, resulting in dramatic decreases in heat transfer coefficient. Simultaneous liquid and vapor thermoreflectance measurements allow calculations of instantaneous and time-averaged heat transfer coefficients. Validation, calibration and uncertainty of the technique are discussed.