{"title":"FiX-compact:一种新的x容忍响应压缩方案,用于固定未知逻辑值","authors":"Jaeseok Park, Sungho Kang","doi":"10.1109/SOCDC.2010.5682936","DOIUrl":null,"url":null,"abstract":"This paper proposes a new X-tolerant response compaction scheme with a practical assumption where the unknown values are generated on fixed scan chains. The proposed scheme guarantees fault diagnosis and treats simultaneous unknown logic values. In addition, it requires simple compactor structure composed of XOR gates, and it does not need any additional signal from the outside.","PeriodicalId":380183,"journal":{"name":"2010 International SoC Design Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"FiX-compact: A new X-tolerant response compaction scheme for fixed unknown logic values\",\"authors\":\"Jaeseok Park, Sungho Kang\",\"doi\":\"10.1109/SOCDC.2010.5682936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new X-tolerant response compaction scheme with a practical assumption where the unknown values are generated on fixed scan chains. The proposed scheme guarantees fault diagnosis and treats simultaneous unknown logic values. In addition, it requires simple compactor structure composed of XOR gates, and it does not need any additional signal from the outside.\",\"PeriodicalId\":380183,\"journal\":{\"name\":\"2010 International SoC Design Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International SoC Design Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOCDC.2010.5682936\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International SoC Design Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCDC.2010.5682936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
FiX-compact: A new X-tolerant response compaction scheme for fixed unknown logic values
This paper proposes a new X-tolerant response compaction scheme with a practical assumption where the unknown values are generated on fixed scan chains. The proposed scheme guarantees fault diagnosis and treats simultaneous unknown logic values. In addition, it requires simple compactor structure composed of XOR gates, and it does not need any additional signal from the outside.