{"title":"一种新的多晶硅薄膜晶体管电荷泵浦模型","authors":"Kee-Jong Kim, Seong-Gyun Kim, W. Park, O. Kim","doi":"10.1109/TENCON.1995.496332","DOIUrl":null,"url":null,"abstract":"A charge pumping model considering bulk states in polysilicon thin film transistors has been developed. Here, we define the threshold voltage as a minimum voltage to fill the untrapped states within an applied pulse width. And the threshold voltage including the emission energy level was obtained as a function of depth. It shows that the calculated current of this model is more consistent with the measured one rather than the current or interface state model.","PeriodicalId":425138,"journal":{"name":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new charge pumping model for polysilicon thin film transistors\",\"authors\":\"Kee-Jong Kim, Seong-Gyun Kim, W. Park, O. Kim\",\"doi\":\"10.1109/TENCON.1995.496332\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A charge pumping model considering bulk states in polysilicon thin film transistors has been developed. Here, we define the threshold voltage as a minimum voltage to fill the untrapped states within an applied pulse width. And the threshold voltage including the emission energy level was obtained as a function of depth. It shows that the calculated current of this model is more consistent with the measured one rather than the current or interface state model.\",\"PeriodicalId\":425138,\"journal\":{\"name\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.1995.496332\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1995.496332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new charge pumping model for polysilicon thin film transistors
A charge pumping model considering bulk states in polysilicon thin film transistors has been developed. Here, we define the threshold voltage as a minimum voltage to fill the untrapped states within an applied pulse width. And the threshold voltage including the emission energy level was obtained as a function of depth. It shows that the calculated current of this model is more consistent with the measured one rather than the current or interface state model.