空间电荷和电阻对场发射饱和的影响

Guo-Ning Wang, Kaviya Aranganadin, Y. Lan, H. Hsu, J. Verboncoeur, Ming-Chieh Lin
{"title":"空间电荷和电阻对场发射饱和的影响","authors":"Guo-Ning Wang, Kaviya Aranganadin, Y. Lan, H. Hsu, J. Verboncoeur, Ming-Chieh Lin","doi":"10.1109/IVNC57695.2023.10188956","DOIUrl":null,"url":null,"abstract":"Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Space Charge and Resistance Effects on Saturation of Field Emission\",\"authors\":\"Guo-Ning Wang, Kaviya Aranganadin, Y. Lan, H. Hsu, J. Verboncoeur, Ming-Chieh Lin\",\"doi\":\"10.1109/IVNC57695.2023.10188956\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.\",\"PeriodicalId\":346266,\"journal\":{\"name\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC57695.2023.10188956\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC57695.2023.10188956","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

强外加电场作用下的场发射饱和现象已经有几十年的实验观察和理论研究。基本上,饱和可以归因于以电阻为特征的衬底效应或以表面电场减小为特征的空间电荷效应。本文采用基于细胞内粒子法的自一致模型与电路建模相结合的方法,研究了这两种效应导致的场发射饱和,以了解其对电学特性的影响以及所造成的不同特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Space Charge and Resistance Effects on Saturation of Field Emission
Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.
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