{"title":"嵌入式微电子系统粗粒度并行程序的形式化验证","authors":"S. Pakharev, A. Syschikov","doi":"10.1109/WECONF.2018.8604425","DOIUrl":null,"url":null,"abstract":"This paper described formal verification of coarse-grained programs by example of programs created by VPL language at VIPE IDE. The article discusses methods that allow the verification of the program to identify the main errors specific to parallel programs.","PeriodicalId":198958,"journal":{"name":"2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems\",\"authors\":\"S. Pakharev, A. Syschikov\",\"doi\":\"10.1109/WECONF.2018.8604425\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper described formal verification of coarse-grained programs by example of programs created by VPL language at VIPE IDE. The article discusses methods that allow the verification of the program to identify the main errors specific to parallel programs.\",\"PeriodicalId\":198958,\"journal\":{\"name\":\"2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WECONF.2018.8604425\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WECONF.2018.8604425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fonmal Verification of Coarse-Grained Parallel Programs for Embedded Microelectronic Systems
This paper described formal verification of coarse-grained programs by example of programs created by VPL language at VIPE IDE. The article discusses methods that allow the verification of the program to identify the main errors specific to parallel programs.