基于n图分析的GUI软件故障定位

Zhongxing Yu, Hai Hu, Chenggang Bai, K. Cai, W. E. Wong
{"title":"基于n图分析的GUI软件故障定位","authors":"Zhongxing Yu, Hai Hu, Chenggang Bai, K. Cai, W. E. Wong","doi":"10.1109/HASE.2011.29","DOIUrl":null,"url":null,"abstract":"Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today's software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.","PeriodicalId":403140,"journal":{"name":"2011 IEEE 13th International Symposium on High-Assurance Systems Engineering","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"GUI Software Fault Localization Using N-gram Analysis\",\"authors\":\"Zhongxing Yu, Hai Hu, Chenggang Bai, K. Cai, W. E. Wong\",\"doi\":\"10.1109/HASE.2011.29\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today's software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.\",\"PeriodicalId\":403140,\"journal\":{\"name\":\"2011 IEEE 13th International Symposium on High-Assurance Systems Engineering\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 13th International Symposium on High-Assurance Systems Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HASE.2011.29\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 13th International Symposium on High-Assurance Systems Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HASE.2011.29","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

图形用户界面(gui)已成为与当今软件交互的重要且公认的方式。故障定位被认为是最昂贵的程序调试活动之一。本文提出了一种面向GUI软件的故障定位技术。与传统软件不同,GUI测试用例通常是事件序列,每个单独的事件都有一个唯一的对应事件处理程序。我们将数据挖掘技术应用于事件序列及其在测试阶段收集的故障检测的输出数据,以对事件处理程序的故障倾向进行排序,以进行故障定位。我们的方法应用N-gram分析对GUI程序的事件处理程序进行排序,并且从四个实际GUI程序的案例研究中收集的数据证明了所提出技术的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
GUI Software Fault Localization Using N-gram Analysis
Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today's software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信