技术独立边界扫描合成(设计流程问题)

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI:10.1109/EURDAC.1993.410670

M. Robinson

{"title":"技术独立边界扫描合成(设计流程问题)","authors":"M. Robinson","doi":"10.1109/EURDAC.1993.410670","DOIUrl":null,"url":null,"abstract":"A design flow paradigm that integrates technology independent boundary scan synthesis into a chip design methodology is presented. The approach accommodates multiple vendor boundary scan technologies and the requirements of (sometimes non-1149.1-compliant) user specified boundary scan architectures. Boundary scan synthesis is described and design-specific requirements, 1149.1 compliance verification, boundary scan manufacturing test, and interfacing with the board and system test environments are discussed.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"92 8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Technology independent boundary scan synthesis (design flow issues)\",\"authors\":\"M. Robinson\",\"doi\":\"10.1109/EURDAC.1993.410670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A design flow paradigm that integrates technology independent boundary scan synthesis into a chip design methodology is presented. The approach accommodates multiple vendor boundary scan technologies and the requirements of (sometimes non-1149.1-compliant) user specified boundary scan architectures. Boundary scan synthesis is described and design-specific requirements, 1149.1 compliance verification, boundary scan manufacturing test, and interfacing with the board and system test environments are discussed.<<ETX>>\",\"PeriodicalId\":339176,\"journal\":{\"name\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"volume\":\"92 8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURDAC.1993.410670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1993.410670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

提出了一种将技术无关的边界扫描合成集成到芯片设计方法中的设计流程范例。该方法适应多种供应商边界扫描技术和用户指定的边界扫描架构的需求(有时不符合1149.1)。描述了边界扫描合成，并讨论了设计特定要求，符合性验证，边界扫描制造测试以及与电路板和系统测试环境的接口。

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Technology independent boundary scan synthesis (design flow issues)

A design flow paradigm that integrates technology independent boundary scan synthesis into a chip design methodology is presented. The approach accommodates multiple vendor boundary scan technologies and the requirements of (sometimes non-1149.1-compliant) user specified boundary scan architectures. Boundary scan synthesis is described and design-specific requirements, 1149.1 compliance verification, boundary scan manufacturing test, and interfacing with the board and system test environments are discussed.<>

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来源期刊

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference

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