{"title":"大规模制造过程建模的新方法:利用过程挖掘方法和专家知识","authors":"Pamela Viale, C. Frydman, J. Pinaton","doi":"10.1109/AICCSA.2011.6126595","DOIUrl":null,"url":null,"abstract":"Modeling manufacturing process of complex products like electronic chips is crucial to maximize the quality of the production. This paper proposes a new methodology to model large scale manufacturing processes based on activity information as well as experts' knowledge. DEVS formalism is used for the final models because of its advantages as a formal formalism. This methodology helps to easily detect discrepancies between the actual implementation of processes with experts' definitions. It also helps to construct general models that could be used later for controlling processes. The idea of STMicroelectronics enterprise is to use these general models to implement an alarm system. The idea is to alert engineers about risky modifications done over STMicroelectronics manufacturing processes. The state of our work towards to model STMicroelectronics' production processes is presented at the end of this paper.","PeriodicalId":375277,"journal":{"name":"2011 9th IEEE/ACS International Conference on Computer Systems and Applications (AICCSA)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge\",\"authors\":\"Pamela Viale, C. Frydman, J. Pinaton\",\"doi\":\"10.1109/AICCSA.2011.6126595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modeling manufacturing process of complex products like electronic chips is crucial to maximize the quality of the production. This paper proposes a new methodology to model large scale manufacturing processes based on activity information as well as experts' knowledge. DEVS formalism is used for the final models because of its advantages as a formal formalism. This methodology helps to easily detect discrepancies between the actual implementation of processes with experts' definitions. It also helps to construct general models that could be used later for controlling processes. The idea of STMicroelectronics enterprise is to use these general models to implement an alarm system. The idea is to alert engineers about risky modifications done over STMicroelectronics manufacturing processes. The state of our work towards to model STMicroelectronics' production processes is presented at the end of this paper.\",\"PeriodicalId\":375277,\"journal\":{\"name\":\"2011 9th IEEE/ACS International Conference on Computer Systems and Applications (AICCSA)\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 9th IEEE/ACS International Conference on Computer Systems and Applications (AICCSA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AICCSA.2011.6126595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 9th IEEE/ACS International Conference on Computer Systems and Applications (AICCSA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AICCSA.2011.6126595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge
Modeling manufacturing process of complex products like electronic chips is crucial to maximize the quality of the production. This paper proposes a new methodology to model large scale manufacturing processes based on activity information as well as experts' knowledge. DEVS formalism is used for the final models because of its advantages as a formal formalism. This methodology helps to easily detect discrepancies between the actual implementation of processes with experts' definitions. It also helps to construct general models that could be used later for controlling processes. The idea of STMicroelectronics enterprise is to use these general models to implement an alarm system. The idea is to alert engineers about risky modifications done over STMicroelectronics manufacturing processes. The state of our work towards to model STMicroelectronics' production processes is presented at the end of this paper.