{"title":"微波相频法测量层结构界面位置","authors":"B. V. Lunkin, D. V. Khablov","doi":"10.1109/EUMA.1988.333883","DOIUrl":null,"url":null,"abstract":"The paper suggests an approach to the parameter analysis of objects presentable by an equivalent scheme in the form of a plane-parallel layer structure. The approach rests upon the use of the phase-frequency method aimed at processing amplitude frequency characteristics of the reflected signal.","PeriodicalId":161582,"journal":{"name":"1988 18th European Microwave Conference","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of Layer Structures Interface Position using Microwave Phase-Frequency Method\",\"authors\":\"B. V. Lunkin, D. V. Khablov\",\"doi\":\"10.1109/EUMA.1988.333883\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper suggests an approach to the parameter analysis of objects presentable by an equivalent scheme in the form of a plane-parallel layer structure. The approach rests upon the use of the phase-frequency method aimed at processing amplitude frequency characteristics of the reflected signal.\",\"PeriodicalId\":161582,\"journal\":{\"name\":\"1988 18th European Microwave Conference\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 18th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1988.333883\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 18th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1988.333883","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of Layer Structures Interface Position using Microwave Phase-Frequency Method
The paper suggests an approach to the parameter analysis of objects presentable by an equivalent scheme in the form of a plane-parallel layer structure. The approach rests upon the use of the phase-frequency method aimed at processing amplitude frequency characteristics of the reflected signal.
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