用平行热导技术测量单晶平面内热导率

K. Aaron, Xiaofeng Tang, T. Tritt
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引用次数: 5

摘要

由于天然尺寸的限制和大单晶合成的困难,单晶的表征通常涉及使用非常小的样品。由于小样本的热导率低、机械强度低,多年来测量小样本的热导率一直是一个艰巨的挑战。平行热导(PTC)技术是解决这一问题的方法之一。我们尝试用PTC技术测量单晶的面内热导率。本文介绍了PTC技术,并给出了标准样品的测量结果以及对NaxCo2O4单晶的初步测量结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of the in-plane thermal conductivity of single crystals by the parallel thermal conductance technique
The characterization of single crystals often involves working with very small samples because of natural size limitations and the difficulties involved in the synthesis of large single crystals. The measurement of the thermal conductivity of small samples has been a formidable challenge for many years due to the low thermal conductance and the low mechanical strength of the sample. One of the methods developed to address this problem is the Parallel Thermal Conductance (PTC) technique. We have attempted to measure the in-plane thermal conductivity of single crystals using the PTC technique. In this paper we describe the PTC technique and provide results of measurement on standards as well as preliminary measurements on NaxCo2O4 single crystals.
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