{"title":"测量半透明物体三维形状的光散射分析","authors":"K. Ohtani, M. Baba","doi":"10.23919/SICE.2019.8859968","DOIUrl":null,"url":null,"abstract":"The light irradiated into a translucent object is multi-reflected inside and then emitted from a position different from the incident position. This behavior is called subsurface scattering. Understanding subsurface scattering behavior is very important in the measurement of three-dimensional (3-D) shapes and CG representations of translucent objects. In this study, we simulated the subsurface scattering of translucent objects using the ray tracing method, and examined a shape-measurement method for 3-D translucent objects by the spotlight projection method using the simulation results.","PeriodicalId":147772,"journal":{"name":"2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)","volume":"245 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Light scattering analysis for measuring the 3-D shape of a translucent object\",\"authors\":\"K. Ohtani, M. Baba\",\"doi\":\"10.23919/SICE.2019.8859968\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The light irradiated into a translucent object is multi-reflected inside and then emitted from a position different from the incident position. This behavior is called subsurface scattering. Understanding subsurface scattering behavior is very important in the measurement of three-dimensional (3-D) shapes and CG representations of translucent objects. In this study, we simulated the subsurface scattering of translucent objects using the ray tracing method, and examined a shape-measurement method for 3-D translucent objects by the spotlight projection method using the simulation results.\",\"PeriodicalId\":147772,\"journal\":{\"name\":\"2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)\",\"volume\":\"245 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/SICE.2019.8859968\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 58th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/SICE.2019.8859968","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Light scattering analysis for measuring the 3-D shape of a translucent object
The light irradiated into a translucent object is multi-reflected inside and then emitted from a position different from the incident position. This behavior is called subsurface scattering. Understanding subsurface scattering behavior is very important in the measurement of three-dimensional (3-D) shapes and CG representations of translucent objects. In this study, we simulated the subsurface scattering of translucent objects using the ray tracing method, and examined a shape-measurement method for 3-D translucent objects by the spotlight projection method using the simulation results.