6合1电源模块可靠性力学仿真与建模

Rathin Mandal, Kazunori Yamamoto, G. Tang
{"title":"6合1电源模块可靠性力学仿真与建模","authors":"Rathin Mandal, Kazunori Yamamoto, G. Tang","doi":"10.1109/ectc51906.2022.00258","DOIUrl":null,"url":null,"abstract":"numerical modeling and simulation of temperature cycling test (TCT) and power cycling test (PCT) are applied to the design reliability analysis for a proposed 6-in-1 power module (PM) package. The fatigue life for both 95Sn5Sb solder interconnect and sintered Ag die attach (DA) joints under TCT and PCT conditions are calculated and compared with a reference power module package which has already passed the reliability test. The Coffin-mansion life model ductility factor is calculated from the test data for the reference power module and applied to the analysis of the fatigue life for the PM. The reliability of solder interconnect is in the same level as the reference module which passed the 1000 cycles of TCT and 50000 cycles of PCT. Sintered Ag DA joint has a very high reliability life. The structural reliability of interconnect for the proposed PM could be further enhanced by using sintered Ag as both DA and interconnect materials. Effect of package parameters such as DA and copper clip thickness are also investigated in this study. The results provided important guidelines for the PM package design.","PeriodicalId":139520,"journal":{"name":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Mechanical simulation and modeling for reliability of 6-in-1 power module\",\"authors\":\"Rathin Mandal, Kazunori Yamamoto, G. Tang\",\"doi\":\"10.1109/ectc51906.2022.00258\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"numerical modeling and simulation of temperature cycling test (TCT) and power cycling test (PCT) are applied to the design reliability analysis for a proposed 6-in-1 power module (PM) package. The fatigue life for both 95Sn5Sb solder interconnect and sintered Ag die attach (DA) joints under TCT and PCT conditions are calculated and compared with a reference power module package which has already passed the reliability test. The Coffin-mansion life model ductility factor is calculated from the test data for the reference power module and applied to the analysis of the fatigue life for the PM. The reliability of solder interconnect is in the same level as the reference module which passed the 1000 cycles of TCT and 50000 cycles of PCT. Sintered Ag DA joint has a very high reliability life. The structural reliability of interconnect for the proposed PM could be further enhanced by using sintered Ag as both DA and interconnect materials. Effect of package parameters such as DA and copper clip thickness are also investigated in this study. The results provided important guidelines for the PM package design.\",\"PeriodicalId\":139520,\"journal\":{\"name\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ectc51906.2022.00258\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc51906.2022.00258","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

将温度循环试验(TCT)和功率循环试验(PCT)的数值模拟和仿真应用于一种6合1功率模块(PM)封装的设计可靠性分析。计算了95Sn5Sb焊料互连和烧结银片连接(DA)接头在TCT和PCT条件下的疲劳寿命,并与已通过可靠性试验的参考功率模块封装进行了比较。根据参考电源模块的试验数据,计算出棺材-豪宅寿命模型的延性系数,并将其应用于PM的疲劳寿命分析。焊料互连的可靠性与通过TCT 1000次循环和PCT 50000次循环的参考模块处于同一水平,烧结Ag - DA接头具有很高的可靠性寿命。采用烧结银作为DA材料和互连材料,可以进一步提高所提出的PM互连结构的可靠性。同时考察了封装参数(DA)、铜夹厚度等参数的影响。研究结果为PM包设计提供了重要的指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mechanical simulation and modeling for reliability of 6-in-1 power module
numerical modeling and simulation of temperature cycling test (TCT) and power cycling test (PCT) are applied to the design reliability analysis for a proposed 6-in-1 power module (PM) package. The fatigue life for both 95Sn5Sb solder interconnect and sintered Ag die attach (DA) joints under TCT and PCT conditions are calculated and compared with a reference power module package which has already passed the reliability test. The Coffin-mansion life model ductility factor is calculated from the test data for the reference power module and applied to the analysis of the fatigue life for the PM. The reliability of solder interconnect is in the same level as the reference module which passed the 1000 cycles of TCT and 50000 cycles of PCT. Sintered Ag DA joint has a very high reliability life. The structural reliability of interconnect for the proposed PM could be further enhanced by using sintered Ag as both DA and interconnect materials. Effect of package parameters such as DA and copper clip thickness are also investigated in this study. The results provided important guidelines for the PM package design.
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