高功率微波增强化学气相沉积法在SiO/ sub2 /表面沉积金刚石膜

Jau-Sung Lee, Kuo-Shung Liu, I. Lin
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引用次数: 0

摘要

采用高功率微波等离子体增强化学气相沉积(CVD)技术,成功地在SiO/ sub2 /涂层硅衬底上成核了金刚石。SiO/sub -2/表面的成核速率(即0.5/spl次/10/sup 10/ cm/sup -2/)仍小于Si表面的成核速率(即1.0/spl次/10/sup 10/ cm/sup -2/)。无论衬底的性质如何,金刚石在预成核表面的生长行为都是相似的。无偏压沉积时,金刚石为单晶柱状结构,取向随机;-100 VDC偏压沉积时,金刚石为多晶柱状结构,取向[001]优先。多晶柱状结构是在偏置电压作用下诱导二次形核的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Deposition of diamond films on SiO/sub 2/ surface using high power microwave enhanced chemical vapor deposition process
Diamonds were successfully nucleated on SiO/sub 2/-coated silicon substrates using high power microwave plasma enhanced chemical vapor deposition (CVD) process. Nucleation rate on SiO/sub 2/ surface (i.e., 0.5/spl times/10/sup 10/ cm/sup -2/) is, however, still smaller than that on Si surface (i.e., 1.0/spl times/10/sup 10/ cm/sup -2/). The growth of diamonds behaved similarly on the pre-nucleated surface, regardless of the nature of the substrates. Diamonds were of single grain columnar structure with random orientation when deposited without bias and were of multigrain columnar structure with [001] preferred orientation when deposited under -100 VDC bias. Multigrain columnar structure was ascribed to the induction of secondary nucleation at the presence of bias voltage.
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